ETS Facility
Microscope Showroom
Warehouse
- Lab Equipment
- Micro Assembly
- Acoustic Imaging, Sonoscan
- Automated Dispensing, Underfill, Encapsulation
- Bonders, Wire
- CO2 Cleaning, Critical Point Dryers
- Cross Sectioning, Micro-cleaving
- Die Attach
- Epoxy, UV Spot Curing, Degassing & Dispensing
- Failure Analysis & Mil Spec Test
- Flip Chip Aligners, Bonders
- Impulse Sealing
- Induction Heating
- Rework Stations
- Laminators
- Pick & Place, Die Ejector Grids
- Plating Benches & Power Supplies
- Screw Machines
- Solder Testing
- Static Eliminators, Detectors
- Ultrasonic Cleaners, degreasers
- UV Ozone Cleaners, Tabletop
- Welders (gap), Solder Reflow, Sealers, Ultrasonic plastic
- Microscopes
- Opto-Mechanical
- AutoAligners and Fiber Optic Positioners
- Exposure Sources, Solar Simulators, and Alignment stages
- Fiber Optic Cleavers, Splicers, Polishers
- Fiber Optic Interferometers, Waveguide Analyzers
- Lasers, BeamScan Instruments
- Laser Displacement Sensors-Keyence
- Laser Workstations & Component Welders
- Motion Control: Stages, Actuators, Controllers
- Optics & Mechanics, Breadboards
- Autocollimators, Radiometers, Photometers, Standards, Choppers, Fiber Light Sources
- Spectrometers & Monochromators
- Test & Measurement, IR Cameras
- Vibration Isolation
- Semi. Process
- Aligners, Exposure & Lithography
- Dicing, Scribing, Wafer/Mask/FPD Cleaners
- Diffusion, Oxidation, Annealing, LPCVD
- Facility: Chillers, Exhaust Gas Abatement, Gas Cabinets, Dessicators
- Lapping, Polishing and Wafer Bonding
- Ovens: HMDS, Image Reversal, Polyimide Bake
- Particle Counters & Clean Room Acces.
- Sorting, Handling, Transfer, Marking, Robots
- Photostabilization and E-beam Cure
- Spin Rinser Dryers, Megasonic cleaners
- Plasma Etching, Ozone Ashers, RIE
- Wafer Bonders and Bond Aligners
- Rapid Thermal Processing
- Resist Coat, Bake, Develop, Strip, Photostabilize
- Spin On Glass
- Metrology
- Resistivity, P/N Type
- Standards for Calibration
- Surface Contamination: Surfscans, Contact Angle
- Surface Interferometry and Wafer Flatness
- Thin Film Metrology: Ellipsometers, Prism couplers, Nanospecs, Stylus Profilers, Flexus
- Atomic Force Microscopes
- CV Measure, SCA, Plasma Damage Monitor
- Defect Inspection & Review
- Probers & Accessories
- Electrical Monitoring & Characterization
- Emission Microscopes, SEM, TEM
- Line Width and Critical Dimension (CD-SEM)
- Mask Inspection and Repair
- PhotoLuminescence
- Implant Monitoring
- Ovens
- Vacuum