Download Complete
Product List
(PDF format)

Semiconductor Metrology

• Atomic Force Microscopes
• CV Measure, SCA, Plasma Damage Monitor
• Defect Inspection & Review
• Electrical Monitoring & Characterization
• Emission Microscopes, SEM, TEM
• Line Width and Critical Dimension (CD-SEM)
• Mask Inspection and Repair
• PhotoLuminescence
• Probers & Accessories
• Resistivity, P/N Type
• Standards for Calibration
• Surface Contamination: Surfscans, Contact Angle
• Surface Interferometry and Wafer Flatness
• Surface Texture, Optical Scatterometers
• Thin Film Metrology: Ellipsometers, Prism couplers, Nanospecs, Stylus Profilers, Flexus
• Wafer Thickness
• X-Ray Fluorescence Spectrometry (XRF)