September 04, 2010

 


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Nanospecs, Spectrometric, Broadband Spectroscopy (N&K)
Addt'l Photo(s): Click for View 2
Manufacturer: Nanometrics
Name / Model#: 4150
Reference #: R-3510
Serial #: 1096-H10806
Mfg Date: 01-Oct-96
Description:
Tabletop film thickness measurement tool with autofocus and programmable mapping stage, Olympus 10x and 40x ULWD objectives, 400-900nm range, single and multilayer film algorithms, contour and 3D mapping, wafer sizes 100mm/ 150mm/ 200mm, 3-60um spot size, 110v, includes Tower PC (not shown in photo)
Price: $36,000.00